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TD-3700 X-Ray Diffractometer

TD-3700 high-resolution X-ray diffractometer is a new member of the TD series. Equipped with a high-speed one-dimensional array detector (MYTHEN2R)or SDD detector, combines rapid analysis, ease of operation, and user security. Modular hardware architecture and customized software systems achieve the perfect combination. With independent intellectual property rights and national invention patent, programmable logic controller (PLC) control technology makes its failure rate extremely low, good anti-interference, to ensure long-term stables operation of high-voltage power supply.

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TD-3700 high-resolution X-ray diffractometer has all the advantages of TD-3500 X-ray diffractometer and is equipped with high-performance array detector. Compared with the scintillation detector or the proportional detector, the intensity of diffraction calculation can be increased more than tens of times, and the complete high sensitivity and high resolution can be obtained in a shorter sampling period.

New features

TD-3700 high-resolution X-ray diffractometer can support the transmission date scanning mode in addition to the conventional diffraction date scanning mode. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. The diffraction mode has strong diffraction signal and is more suitable for phase identification in laboratory. In addition to, in the transmission mode, the powder sample can be micro, suitable for date acquisition when the sample amount is relatively small and the sample preparation requipment s of the diffraction mode are not satisfied.

High-resolution one-dimensional detector

One-dimensional array detector makes full use of mixed photo counting technology, no noise, fast data acquisition, more than ten times faster than the scintillation detector, excellent energy resolution, can effectively remove the fluorescence effect. 640 channel detector has fast readout time, resulting in better signal-to-noise ratio. The detector control system with electronic gating and external trigger can effectively complete the synchronization of the system.

TD-3700 high-resolution X-ray diffractometer sample analysis spectrum display