TDM-20 X-Ray Diffractometer
TDM-20 high-resolution X-ray diffractometer(Bench Type) is mainly used for phase analysis of powders, solids and similar pasty materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis and crystal structure analysis of polycrystalline materials such as powder samples and mental samples. Widely used in industry, agriculture, national defense, pharmaceutical, mineral, food safety, petroleum, education and scientific research and other fields.
TDM-20high-resolution X-ray diffractometer (desktop type) breaks through the original international standard 600w technical index and is upgraded to a brand-new 1600W. And the operation is simple, stable performance, low energy consumption, can be equipped with proportional detector or new high-speed array detector, the performance of the whole machine has a jump.
The equipment is small in size and light in weight；
High frequency and high voltage power supply makes consumption of the whole machine lower；
Can quickly calibrate and test the sample；
The line control is simple and convenient for debugging and installation；
The linearity of full spectrum diffraction angle can reach ±0.01°。
Welcome to contact Tongda for more product related parameters and usage solutions.