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TDM-20 X-Ray Diffractometer
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TDM-20 X-Ray Diffractometer

Complying X-ray diffraction principle to qualitatively or quantitatively analyze polycrystalline materials such as powder samples and metal samples, and analyzing crystal structure. It is widely used in industrial, agricultural, defense, pharmaceutical, mineral, food safety, petroleum, education and scientific research fields.
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The TDM-20 benchtop multi-function powder X-ray diffractometer is one of the world's smallest desktop X-ray diffractometers.

 

Complying X-ray diffraction principle to qualitatively or quantitatively analyze polycrystalline materials such as powder samples and metal samples, and analyzing crystal structure. It is widely used in industrial, agricultural, defense, pharmaceutical, mineral, food safety, petroleum, education and scientific research fields.

 

• The instrument is plug and play

• Modular design and standardized interface technology solutions

• Advanced high frequency and high voltage power supply technology enables lower power consumption

• The highly integrated desktop cooling circulating water system TZL-30M makes equipment performance more reliable.

 


 

There is more!

In addition to enhancing the ease of use, stability and energy consumption of the TDM-10, TDM-20 has a leap-forward improvement in the performance thanks to the new high-performance matrix detector.

 

High-precision semiconductor microstrip detector (array detector) consists of 640semiconductor microstrips composing, compared to the traditional scintillation
detector, can improve the diffraction calculation intensity 100 times that of SC, you can get complete high sensitivity and high resolution in a short sampling period rate of diffraction pattern and higher count intensity. High precision semiconductor microstrip detector single pass channel count dynamic data range 24 bits, count 16777216 detector count up to 1X10^9cps; at the same time with DCS controller readout time is only 89μs.

 

MYTHEN2 linear array X-ray detector

 

The MYTHEN detector system completely changed the standard definition of X-ray powder diffraction crystallography, presenting another dimension: imaging time. This exciting new field combines perfectly with the MYTHEN2 X detector, opening a new era of time resolution and field research. Based on the MYTHEN strip size and point spread function, MYTHEN2 X introduces an unprecedented frame rate in the dynamic range, challenging the limits of the energy range. The detector control system with electronic gating and external triggering (DCS4) combines a customized multi-module solution with detectors that are fully synchronized with other systems. The time horizon is not a major factor in the balance between data quality and system flexibility. From field stress measurements to rapid phase transitions, MYTHEN2 X deepens its details and enables observation in solid state reactions.

 

 



The MYTHEN2 X detector uses a combination of 4 modules with a frame rate of 1000 Hz and a dynamic range of 24 bits. These new developments do not require a balance of data quality. MYTHEN's 50 micron tapes are available in two lengths to ensure high resolution and signal to noise ratio in the X-ray energy range.

 

 

 

 

 

 

 

 

The all-round MYTHEN2 X-Series detectors feature HPC technology with three thick sensors and two long data bands, covering all X-ray analysis needs in 4 and 40 keV. The MYTHEN2 module is designed for two sizes: 1280 lined MYTHEN2 R 1K and 640 lined MTHEN2 R 1D. The MYTHEN2 R detector is suitable for any diffractometer with its compact size and symmetrical sensor structure. Whether it is a compact space or a multi-module system setup, the four-module system can be used for any device shape you want. Simultaneous operation can be performed by using the detector control system DCS4.

 

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