TDM-10 X-Ray Diffractometer
TDM-10 X-ray small diffractometer is mainly used for phase analysis of powders, solids and similar paste materials. The device is small in size, light in weight, low in power consumption, and can quickly calibrate and test samples. The measurement accuracy of the position is 0.001°, which is used for computer control, and the data collection and timely processing can be directly seen under the Windows window.
X-ray diffractometer uses and principles
TD series X-ray diffractometer is mainly used for phase determination, quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic stress or micro stress measurement of powder, solid, similar paste materials or film samples. Grain size measurement, crystallinity measurement, and the like. According to the Debye-Xiele geometry principle, high-precision test results can be obtained, which are widely used in laboratories engaged in geological, marine, biological, chemical, and nuclear reaction stations, as well as in industrial control laboratories and educational laboratories in higher education institutions. Wait.
The basic principle of the powder diffraction method is
A bundle of monochromatic X-rays is incident on a small number of small crystals of completely arbitrary orientation, and the size of the small crystals is approximately 1 to 10 μm. To reduce the preferred orientation, typically the polycrystalline sample is rotated. Assuming that there is a little plane (hkl) in the crystal that satisfies the Bragg reflection condition, the incident ray and the (hkl) lattice plane form an angle θ, and the angle between the reflected line and the incident ray is 2θ. Since the orientation of the small crystal is arbitrary, The diffraction lines of each set of (hkl) planes form a conical surface with an entrance angle of 4θ corresponding to the incident ray. For a lattice plane group satisfying the Bragg reflection condition, the lattice plane spacing is larger than λ/2 (that is, sin θ < 1), and the corresponding diffraction line cone surface can be obtained. All experimental methods of powder X-ray diffraction include an X-ray source and an experimental apparatus for correctly recording crystal diffraction lines satisfying Bragg's law.