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Thin Film Diffraction
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Thin film attachment Graphite Monochromator
θ-2θ Scanning Test
ωscan of the film(also known as rocking curve test)
ωscan of diffraction piak of film(0.0.10)
In the figure, the * mark is the substrate peak, and the other peaks are the diffraction peaks of the film (001) face. Test requirements: required to accurately determine the offset angle of the substrate
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