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Thin Film Diffraction

In the figure, the * mark is the substrate peak, and the other peaks are the diffraction peaks of the film (001) face. Test requirements: required to accurately determine the offset angle of the substrate
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参数

 

  Thin film attachment   Graphite Monochromator

 

 

  θ-2θ Scanning Test

 

 

  ωscan of the film(also known as rocking curve test)
  ωscan of diffraction piak of film(0.0.10)

  In the figure, the * mark is the substrate peak, and the other peaks are the diffraction peaks of the film (001) face. Test requirements: required to accurately determine the offset angle of the substrate

 

 

 

 

 

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