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Thin Film Diffraction

In the figure, the * mark is the substrate peak, and the other peaks are the diffraction peaks of the film (001) face. Test requirements: required to accurately determine the offset angle of the substrate
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Product description
Parameters

 

　　Thin film attachment   Graphite Monochromator

 

 

　　θ-2θ Scanning Test

 

 

　　ωscan of the film(also known as rocking curve test)
　　ωscan of diffraction piak of film(0.0.10)

　　In the figure, the * mark is the substrate peak, and the other peaks are the diffraction peaks of the film (001) face. Test requirements: required to accurately determine the offset angle of the substrate

 

 

 

 

 

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