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Product
product description
TZG-5 Multi-Function Integrated Measurement Accessory
Features:
Polarography test using transmission or reflection Stress testing can be performed usinq the tilting method or the same tilting method. Film testing (in-plane rotation of the sample)
Application
• Evaluation of metal assembly structures such as rolled sheets
• Evaluation of ceramic orientation
•Evaluation of the preferred orientation of the film sample crystal
• Residual residual stress of various metal materials and ceramic materials
• Test (evaluation of wear resistance, chip resistance, etc.)
• Residual stress test of multilayer film (evaluation of film peeling, etc.)
• High temperature superconducting material film, metal plate and other surfaces
• Analysis of oxidation and nitride films Glass, Si, multilayer film on metal substrate
• Analysis (magnetic film, metal surface hardening film, etc.)
• Analysis of electroplating materials such as macromolecular materials; paper, and lenses
• pole diagram measurement
• Stress measuremen
ODF constant Ø section view Anti-polar graph representation
Specification
- α axis:Range:45°- 90°, min step:0.001°/step
- βaxis:step Range:0°-360°, min step 0.005°/step
- Z axis:Ranged 10mm, min step 0.001 mm/step
- Y axis:step Range:±10mm, Swing horizontally at 45°
- Sample size:Max ?40mm, thickness 10mm
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