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TZG-5 Multi-Function Integrated Measurement Accessory
Multi-function integrated measurement accessory
It is designed and installed on the wide-angle goniometer, which is used to analyze the film on the plate material, block material and substrate, and to detect crystal phase orientation and stress.
Functional characteristics
Carry out polar diagram test by transmission and reflection;
The stress test can be carried out by the parallel dip method or the same dip method;
Film test(sample in-plane rotation)
Application area
Evaluation of aggregate structure of metals such as rolled plate;
Evaluation of ceramic;
Evaluation of preferred orientation of thin film samples;
Residual stress test of various metal materials and ceramic materials(evaluation of wear resistance, cutting resistance etc.);
Resistance stress testing of the multilayer film(evaluation of peeling of the film, etc.);
Analysis of Oxidation and Nitriding Films on the Surface of High Temperature Superconducting material film and metal plate;
Analysis of basic multilayer films of glass, SI, metal (magnetic film, metal surface hardened film, etc.);
Analysis of macromolecular materials, paper, lens and other electroplating materials.
Technical specifications
Α axis(tilt): Range of motion -45°~90°, Smaller stride length 0.001°/step
Β axis(in-plane rotation): Range of motion 0°~360°, Small stride length 0.001°/step
X axis: Range of motion: Range of motion ±10mm,Small stride length 0.001mm/step
Y axis: Range of motion: Small stride length 0.001mm/step
Z axis:(forward and backward rotation): Range of motion ±10mm, Small stride length 0.001mm/step
Samples size: larger mediumΦ40mm,thickness10mm
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